STI 5000C transistor plotter

Test scope:

The 5000C test system is an intelligent test system for high-speed and multi-purpose semiconductor discrete devices. It has very rich programming software and powerful testing ability. It can truly and accurately test the large, medium and small power semiconductor discrete devices of 19 categories and 27 classifications.

1、 Testable Devices

1. Diode 2. Zener diode

3. Transistor (NPN type/PNP type)

4. SCR of silicon controlled rectifier (common thyristor)

5. Bidirectional thyristor TRIAC

6. MOSFET Power MOSFET (N-channel/P-channel)

7. Junction FET J-FET (N-channel/P-channel, depleted/enhanced)

8. Three terminal regulator REGULATOR (positive voltage/negative voltage, fixed/variable)

9. Insulated gate bipolar high-power transistor IGBT (NPN type/PNP type)

10. Opto coupler (NPN type/PNP type)

11. Opto logic device OPTO-LOGIC

12. OPTO-SWITCH

13. Darlington Array

14. Solid state overvoltage protector SSOVP

15. Silicon trigger switch STS

16. Relay RELAY (Type A, B, C)

17. Metal oxide varistor MOV

18. Varistor

19. Bidirectional trigger diode DIAC

Technical parameters and achievable goals

Main pole voltage: 1000V can be expanded to 2000V (5000V reserved) through internal setting

Main pole current: 50A with options, which can be extended to: 400A/500A/1000A/1250A, 2500A (reserved)

Control pole voltage: 20V, current increasing table option can be extended to 80V

Control electrode current: 10A, the current table option can be extended to: 40A

Voltage resolution: 1mV

Current resolution: 100pA plus small current table option can be extended to: 1pA