IpTEST is a European brand, focusing on the dynamic and static parameter testing of semiconductor discrete devices such as MOSFET and IGBT. For example, RDSON, BVDSS, VGSth, Switching time, TRR, QRR, reverse recovery test, Qg, gate charge test, Rg gate resistance test, etc. World famous European semiconductor manufacturers, such as Infineon, Italian French Semiconductor, NXP, etc., all use the dynamic and static tester of ipTEST for the final test of static and dynamic tests or wafer testing. This test system can test SiC silicon carbide and GaN gallium nitride devices.